Orientation and layer thickness dependence on the longitudinal magnetization and transverse magnetization hysteresis loops of sputtered multilayer Fe/Si and Fe/Ge thin films

Journal of Physics Condensed Matter

Volumn 16, Issue 23, 2004, Pages 4121-4129

  Morley, N A ^a   Gibbs, M R J ^a   Fronc, K ^b   Zuberek, R ^b  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b INSTITUTE OF PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; MAGNETIC HYSTERESIS; MAGNETIZATION; MOLECULAR BEAM EPITAXY; MULTILAYERS; SEMICONDUCTOR MATERIALS; THICKNESS MEASUREMENT;

CUBIC ANISOTROPY; ENERGY DENSITY; IRON FILMS; MAGNETIC ENERGY;

THIN FILMS;

EID: 3042682371     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/16/23/026     Document Type: Article

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