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Volumn 284-288, Issue PART II, 2000, Pages 1237-1238
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Thickness dependence of cubic anisotropy constant in sputtered Fe films on GaAs substrates
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Author keywords
Ferromagnetic resonance; Magnetic anisotropy; Thin films
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Indexed keywords
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EID: 22244481302
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4526(99)02487-4 Document Type: Article |
Times cited : (7)
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References (4)
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