SCOPUS 정보 검색 플랫폼

Volumn 25, Issue 4, 2003, Pages 210-215

Measurements of absolute x-ray generation efficiency for selected K, L, and M-lines

Author keywords

Fluorescent x rays; Generation efficiency; Microanalysis

Indexed keywords

COMPUTER SIMULATION; ELECTRIC POTENTIAL; X RAYS;

X -RAY GENERATION;

SCANNING;

ANALYTIC METHOD; ARTICLE; ELECTRON BEAM; PRIORITY JOURNAL; PRODUCTIVITY; X RAY;

EID: 0042090694 PISSN: 01610457 EISSN: None Source Type: Journal
DOI: 10.1002/sca.4950250408 Document Type: Article

Times cited : (9)

References (11)

1
- 0041341408
- K x-ray yields from elements of low atomic number
- Campbell AJ: K x-ray yields from elements of low atomic number. Proc R Soc London, A274, 319-342 (1963)
- (1963) Proc R Soc London , vol.A274 , pp. 319-342
- Campbell, A.J.¹

2
- 0000895671
- Sur les bases physiques de l'analyse ponctuelle par spectrographie x.j.
- Castaing R, Descamps J: Sur les bases physiques de l'analyse ponctuelle par spectrographie x.j. Phys Rad 16, 304-317 (1955)
- (1955) Phys Rad , vol.16 , pp. 304-317
- Castaing, R.¹ Descamps, J.²

3
- 0003844131
- Van Nostrand, New York
- Compton AH, Allison SK: X-rays in Theory and Experiment, Van Nostrand, New York (1935)
- (1935) X-Rays in Theory and Experiment
- Compton, A.H.¹ Allison, S.K.²

4
- 0041341409
- DTSA-Desktop spectrum analyzer (US Patent 529913) (1992)
- Fiori CE, Swyt CR, Myklebust RL: DTSA-Desktop spectrum analyzer (US Patent 529913) (1992)
- Fiori, C.E.¹ Swyt, C.R.² Myklebust, R.L.³

5
- 0003539132
- Plenum, New York
- Goldstein JI, Newbury DE, Echlin P, Joy DC, Romig AD, Lyman CE, Fiori C, Lifshin E: Scanning Electron Microscopy and Microanalysis, 2nd Ed. Plenum, New York, (1992) 744-777
- (1992) Scanning Electron Microscopy and Microanalysis, 2nd Ed. , pp. 744-777
- Goldstein, J.I.¹ Newbury, D.E.² Echlin, P.³ Joy, D.C.⁴ Romig, A.D.⁵ Lyman, C.E.⁶ Fiori, C.⁷ Lifshin, E.⁸

6
- 0042079626
- Measurements of K, L, and M shell x-ray production efficiencies
- Green M, Cosslett VE: Measurements of K, L, and M shell x-ray production efficiencies. Br J Appl Phys (J Phys D) 1, 425-436 (1968)
- (1968) Br J Appl Phys (J Phys D) , vol.1 , pp. 425-436
- Green, M.¹ Cosslett, V.E.²

7
- 0031400062
- CASINO: A new Monte Carlo code
- Hovington P, Drouin D, Gauvin R, Joy DC, Evans N: CASINO: A new Monte Carlo code. Scanning 19, 29-35 (1997)
- (1997) Scanning , vol.19 , pp. 29-35
- Hovington, P.¹ Drouin, D.² Gauvin, R.³ Joy, D.C.⁴ Evans, N.⁵

8
- 0030279914
- Measurement of detector efficiencies in the SEM
- Joy DC, Joy CS, Bunn RD: Measurement of detector efficiencies in the SEM. Scanning, 18, 533-538 (1996)
- (1996) Scanning , vol.18 , pp. 533-538
- Joy, D.C.¹ Joy, C.S.² Bunn, R.D.³

10
- 0004129962
- Oxford University Press, New York
- Joy DC: Monte Carlo Modelling for Electron Microscopy and Microanalysis, Oxford University Press, New York (1995) 174-198
- (1995) Monte Carlo Modelling for Electron Microscopy and Microanalysis , pp. 174-198
- Joy, D.C.¹

11
- 0042844112
- Proc 8th IXCOM, Boston (Ed. Beaman DR, Ogilvie RE, Wittry DB), Pendell Publishers, MI
- Lifshin E, Ciccarelli MF, Bolon R: New Measurements of the voltage dependence of absolute x-ray yields. Proc 8th IXCOM, Boston 1977 (Ed. Beaman DR, Ogilvie RE, Wittry DB), Pendell Publishers, MI (1980) 141-148
- (1977) New Measurements of the Voltage Dependence of Absolute X-Ray Yields , pp. 141-148
- Lifshin, E.¹ Ciccarelli, M.F.² Bolon, R.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.