Quantitative characterization of edge enhancement in phase contrast x-ray imaging

Medical Physics

Volumn 31, Issue 6, 2004, Pages 1372-1383

  Monnin, P ^a   Bulling, S ^a   Hoszowska, J ^b   Valley, J F ^a   Meuli, R ^c   Verdun, F R ^a  

^a UNIVERSITY OF LAUSANNE   (Switzerland)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c LAUSANNE UNIVERSITY HOSPITAL   (Switzerland)

Author keywords

Image enhancement; Phase contrast imaging; Radiography; Synchrotron radiation

Indexed keywords

ANALYTICAL MODELS; HOLOGRAPHY; IMAGE ENHANCEMENT; RADIOGRAPHY; SYNCHROTRON RADIATION; X RAY RADIOGRAPHY;

ANALYTICAL APPROACH; CYLINDRICAL FIBERS; DETECTOR RESOLUTION; EDGE-ENHANCEMENT EFFECTS; IMAGING PARAMETERS; PHASE-CONTRAST IMAGING; QUANTITATIVE CHARACTERIZATION; SPATIAL RESOLUTION;

PHASE COMPARATORS;

ARTICLE; ENERGY; GEOMETRY; IMAGING SYSTEM; MATHEMATICAL ANALYSIS; PHASE CONTRAST IMAGING; PHASE CONTRAST X RAY IMAGING; PRIORITY JOURNAL; RADIOGRAPHY; SYNCHROTRON; X RAY;

EID: 3042661980     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.1755568     Document Type: Article

References (18)

1. A. Momose, T. Takeda, Y. Itai, and K. Hirano, "Phase-contrast x-ray computed tomography for observing biological soft tissues," Nat. Med. 2, 473-475 (1996).
2. S. W. Wilkins, T. E. Gureyev, D. Gao, A. Pogany, and A. W. Stevenson, "Phase-contrast imaging using polychromatic hard x-rays," Nature (London) 384, 335-338 (1996).
3. P. Cloetens, R. Barrett, J. Baruchel, J.-P. Guigay, and M. Schlenker, "Phase objects in synchrotron radiation hard x-ray imaging," J. Phys. D 29, 133-146 (1996).
4. P. Cloetens, W. Ludwig, J. Baruchel, J.-P. Guigay, P. Pemot-Rejmankova, M. Salomé-Pateyron, M. Schlenker, J.-Y. Buffière, E. Maire, and G. Peix, "Hard x-ray phase imaging using simple propagation of a coherent synchrotron radiation beam," J. Phys. D 32, A145-A151 (1999).
5. Y. Hwu, W.-L. Tsai, A. Groso, G. Margaritondo, and J. H. Je, "Coherence-enhanced synchrotron radiology: Refraction versus diffraction mechanisms," J. Appl. Phys. 86, 4613-4661 (1999).
6. J. C. Labiche, J. Segura-Puchades, D. Van Brussel, and J. P. Moy, "FRELON camera: Fast REadout LOw Noise," ESRF Newsletters 25, 41-43 (1996).
7. F. Arfelli et al., "Low-dose phase contrast x-ray medical imaging," Phys. Med. Biol. 43, 2845-2852 (1998).
8. N. Yagi, Y. Suzuki, and K. Umetani, "Refraction-enhanced x-ray imaging of mouse lung using synchrotron radiation source," Med. Phys. 26, 2190-2193 (1999).
9. V. Kohn, I. Snigireva, and A. Snigirev, "Interferometric characterization of spatial coherence of high energy synchrotron x-rays," Opt. Commun. 198, 293-309 (2001).
10. M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, Oxford, 1980).
11. M. Z. Kiss, D. E. Sayers, and Z. Zhong, "Measurements of image contrast using diffraction enhanced imaging," Phys. Med. Biol. 48, 325-340 (2003).
12. B. L. Henke, E. M. Gullikson, and J. C. Davis, "X-ray interactions-photoabsorption, scattering, transmission, and reflection at E =50-30 000 eV, Z= 1-92," At. Data Nucl. Data Tables 54, 181-342 (1993).
13. A. Snigirev, I. Snigireva, V. Kohn, S. Kuznetsov, and I. Schelokov, "On the possibilities of x-ray phase contrast microimaging by coherent high-energy synchrotron radiation," Rev. Sci. Instrum. 66, 5486-5492 (1995).
14. V. N. Ingal and E. A. Beliaevskaya, "X-ray plane-wave topography observation of the phase contrast from a non-crystalline object," J. Phys. D 28, 2314-2317 (1995).
15. P. Cloetens, M. Payteron-Salomé, J. Y. Buffière, G. Peix, J. Baruchel, F. Peyrin, and M. Schlenker, "Observation of microstructure and damage in materials by phase sensitive radiography and tomography," J. Appl. Phys. 81, 5878-5886 (1997).
16. A. Pogany, D. Gao, and S. W. Wilkins, "Contrast and resolution in imaging with a microfocus x-ray source," Rev. Sci. Instrum. 68, 2774-2782 (1997).
17. Y. Suzuki, N. Yagi, K. Uesugi, "X-ray refraction-enhanced imaging and a method for phase retrieval for a simple object," J. Synchrotron Radiat. 9, 160-165 (2002).
18. G. Margaritondo and G. Tromba, "Coherence-based edge diffraction sharpening of x-ray images: A simple model," J. Appl. Phys. 85, 3406-3408 (1999).