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Volumn 28, Issue 1, 1999, Pages 9-18

Characteristic x-ray imaging by means of filters

Author keywords

[No Author keywords available]

Indexed keywords

BANDPASS FILTERS; ELECTRON PROBE MICROANALYSIS; FLUORESCENCE MICROSCOPY; X RAY ANALYSIS; X RAY DETECTORS;

EID: 0033477160     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4539(199901/02)28:1<9::AID-XRS299>3.0.CO;2-L     Document Type: Article
Times cited : (6)

References (24)
  • 2
    • 85153554623 scopus 로고
    • ed. by L. Reimer, Springer Series in Optical Sciences No. 45. Springer, Berlin
    • L. Reimer, in Scanning Electron Microscopy, ed. by L. Reimer, Springer Series in Optical Sciences No. 45, p. 396. Springer, Berlin (1985).
    • (1985) Scanning Electron Microscopy , pp. 396
    • Reimer, L.1
  • 21
  • 22
    • 85153547302 scopus 로고
    • Thesis, University of Reims
    • D. Mouze, Thesis, University of Reims, p. 273 (1991).
    • (1991) , pp. 273
    • Mouze, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.