The role of atomic scale investigation in the development of nanoscale materials for information storage applications

Microscopy and Microanalysis

Volumn 10, Issue 3, 2004, Pages 366-372

  Petford Long, A K ^a   Larson, D J ^b   Cerezo, A ^a   Portier, X ^c   Shang, P ^c   Ozkaya, D ^a   Long, T ^a   Clifton, P H ^d  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b SEAGATE TECHNOLOGY   (United States)

^c IBM   (United States)

^d NONE

Author keywords

Atom probe microanalysis; Information storage materials; Interfacial mixing; Transmission electron microscopy

Indexed keywords

ALLOY; COBALT; COPPER; IRON; NICKEL;

CONFERENCE PAPER; DATA STORAGE DEVICE; ELECTRON PROBE MICROANALYSIS; INFORMATION RETRIEVAL; MAGNETISM; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY;

ALLOYS; COBALT; COMPUTER STORAGE DEVICES; COPPER; ELECTRON PROBE MICROANALYSIS; INFORMATION STORAGE AND RETRIEVAL; IRON; MAGNETICS; MICROSCOPY, ELECTRON, SCANNING; NANOTECHNOLOGY; NICKEL;

EID: 3042576369     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604040528     Document Type: Conference Paper

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