Infrared measurements of InN films at low temperatures

Physica Status Solidi C: Conferences

Volumn , Issue 7, 2003, Pages 2838-2841

  Ishitani, Y ^a,b   Xu, K ^b   Terashima, W ^a   Hashimoto, N ^a   Yoshitani, M ^a   Hata, T ^a   Yoshikawa, A ^a,b  

^a CHIBA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON CONCENTRATION; INFRARED MEASUREMENTS; LONGITUDINAL OPTICAL; PHONON-PLASMON COUPLING; REFLECTANCE SPECTRUM; SAPPHIRE SUBSTRATES; TEMPERATURE DEPENDENCE; TRANSMISSION MEASUREMENTS;

MOLECULAR BEAM EPITAXY; NITRIDES; REFLECTION; SAPPHIRE;

LIGHT TRANSMISSION;

EID: 2942697342     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200303400     Document Type: Conference Paper

References (7)

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