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Volumn , Issue , 1998, Pages 402-407
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A statistical performance simulation methodology for VLSI circuits
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Author keywords
[No Author keywords available]
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Indexed keywords
INTELLIGENT SYSTEMS;
MONTE CARLO METHODS;
TIMING CIRCUITS;
VLSI CIRCUITS;
COMPUTATIONAL COMPLEXITY;
COMPUTER SIMULATION;
INTEGRATED CIRCUIT LAYOUT;
INTEGRATED CIRCUIT MANUFACTURE;
STATISTICAL METHODS;
CIRCUIT BLOCKS;
CIRCUIT EVALUATION;
CORNER ANALYSIS;
DEVICE PARAMETERS;
PERFORMANCE DISTRIBUTION;
PERFORMANCE LEVEL;
STATISTICAL INFORMATION;
STATISTICAL PERFORMANCE;
ELECTRIC NETWORK ANALYSIS;
VLSI CIRCUITS;
STATISTICAL PERFORMANCE SIMULATIONS (SPS);
WORST-CASE CORNER ANALYSIS;
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EID: 0031623458
PISSN: 0738100X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1145/277044.277153 Document Type: Conference Paper |
Times cited : (9)
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References (14)
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