Existence of the CuPt-type ordering due to the surface undulation in CdxZn1-xTe epilayers grown on ZnTe buffer layers

Journal of Applied Physics

Volumn 95, Issue 11 I, 2004, Pages 6054-6057

  Lee, H S ^a   Lee, J Y ^a   Kim, T W ^b   Lee, I ^b   Park, H L ^c  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Hanyang University   (South Korea)

^c Yonsei University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CADMIUM COMPOUNDS; ELECTRON DIFFRACTION; EPITAXIAL GROWTH; HIGH RESOLUTION ELECTRON MICROSCOPY; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; STRAIN; SUBLIMATION; SUPERLATTICES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

BUFFER LAYERS; EPILAYERS; LATTICE MISMATCH; SURFACE UNDULATIONS;

COPPER COMPOUNDS;

EID: 2942683283     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1710720     Document Type: Article

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