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Volumn , Issue , 2004, Pages 104-109
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Node voltage dependent subthreshold leakage current characteristics of dynamic circuits
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CMOS INTEGRATED CIRCUITS;
ELECTRIC INVERTERS;
ELECTRIC POWER UTILIZATION;
LOGIC CIRCUITS;
SPURIOUS SIGNAL NOISE;
THRESHOLD VOLTAGE;
TRANSISTORS;
DOMINO LOGIC CIRCUITS;
DYNAMIC CIRCUITS;
NODE VOLTAGE;
NOISE IMMUNITY;
LEAKAGE CURRENTS;
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EID: 2942683261
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ISQED.2004.1283658 Document Type: Conference Paper |
Times cited : (37)
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References (9)
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