High accuracy ultraviolet index of refraction measurements using a Fourier transform spectrometer

Journal of Research of the National Institute of Standards and Technology

Volumn 108, Issue 6, 2003, Pages 429-437

  Gupta, Rajeev ^a   Kaplan, Simon G ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Calcium fluoride; Etalon; Fourier transform spectrometer; Refractive index; Synchrotron; Thermal coefficient; Ultraviolet

Indexed keywords

CALCIUM COMPOUNDS; ETALONS; FLUORIDE MINERALS; FOURIER TRANSFORMS; GONIOMETERS; REFRACTIVE INDEX; SPECTRUM ANALYSIS; SYNCHROTRONS; THICKNESS CONTROL; ULTRAVIOLET RADIATION; UNCERTAIN SYSTEMS; VACUUM;

CALCIUM FLUORIDE; FOURIER TRANSFORM SPECTROMETER; THERMAL COEFFICIENT; ULTRAVIOLET;

REFRACTION;

EID: 2942668359     PISSN: 1044677X     EISSN: None     Source Type: Journal    
DOI: 10.6028/jres.108.037     Document Type: Article

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