Absolute refractive indices and thermal coefficients of CaF2, SrF2, BaF2, and LiF near 157 nm

Applied Optics

Volumn 41, Issue 13, 2002, Pages 2508-2513

  Burnett, John H ^a   Gupta, Rajeev ^a   Griesmann, Ulf ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; EXCIMER LASERS; OPTICAL INSTRUMENT LENSES; PHOTOLITHOGRAPHY; REFRACTIVE INDEX; THERMAL EFFECTS; ULTRAVIOLET RADIATION;

CHROMATIC ABERRATIONS;

OPTICAL MATERIALS;

EID: 0036564009     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.002508     Document Type: Article

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