Fourier transform refractometry

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3425, Issue , 1998, Pages 203-212

  Kaplan, Simon G ^a   Hanssen, Leonard M ^a   Griesmann, Ulf ^a   Gupta, Rajeev ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Fourier transform infrared spectrometer; Glass; Index of refraction; Infrared

Indexed keywords

FOURIER TRANSFORMS; FUSED SILICA; OPTICAL GLASS; REFRACTOMETERS; SPECTROPHOTOMETERS; SPECTRUM ANALYSIS;

FORIER TRANSFORM REFRACTOMETRY;

REFRACTIVE INDEX;

EID: 0032403798     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.326666     Document Type: Conference Paper

References (10)

1. Interspecimen comparison of the refractive index of fused silica
2. Refractive index of arsenic trisulfide
3. Measurements of index of refraction in the deep and vacuum ultraviolet using the minimum deviation method
4. Infrared refractive index of silicon
5. Infrared refractive indices and thermo-optic coefficients for several materials
6. Minimizing error sources in gauge block mechanical comparison measurements
7. Integrating sphere system for absolute measurement of infrared transmittance, reflectance, and absorptance of specular samples
8. Comparison of methods for absolute reflectance measurement in the infrared
9. Optical properties of vitreous arsenic trisulphide
10. The refractive index of air