The mutual exclusion of luminescence and transport in nanocrystalline silicon networks

Journal of Non-Crystalline Solids

Volumn 338-340, Issue 1 SPEC. ISS., 2004, Pages 102-105

  Balberg, I ^a   Savir, E ^a   Jedrzejewski, J ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTROLUMINESCENCE; NANOSTRUCTURED MATERIALS; PHOTOCONDUCTIVITY; PHOTOLUMINESCENCE; QUARTZ; QUENCHING; SEMICONDUCTOR QUANTUM DOTS; SPUTTERING; TRANSMISSION ELECTRON MICROSCOPY;

CARRIER MIGRATION; MIGRATION MECHANISM; QUANTUM EFFECTS; RECOMBINATION CENTERS;

SILICON;

EID: 2942622298     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2004.02.030     Document Type: Conference Paper

References (12)

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9. The authors are indebted to Dr Inna Popov for the TEM data that was taken at the nano-characterization unit of the Hebrew University.
10. Stauffer D., Aharony A. Introduction to Percolation Theory. 1993;Taylor and Francis, London.
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