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Volumn 151, Issue 5, 2004, Pages

Electrical waveform mediated through-mask deposition of solder bumps for wafer level packaging

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRIC CONDUCTANCE; ELECTRODEPOSITION; ELECTRONICS PACKAGING; ENERGY DISSIPATION; FLIP CHIP DEVICES; GRAIN SIZE AND SHAPE; MASKS; MICROPROCESSOR CHIPS; MOUNTINGS; PLATING; SEMICONDUCTOR DEVICES; WAVEFORM ANALYSIS;

EID: 2942620210     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1690784     Document Type: Article
Times cited : (16)

References (21)
  • 2
  • 13
    • 2942518527 scopus 로고    scopus 로고
    • Ph.D. Thesis, Seoul National University, Seoul, Korea
    • N. Kim, Ph.D. Thesis, p. 81, Seoul National University, Seoul, Korea (1996).
    • (1996) , pp. 81
    • Kim, N.1
  • 17
    • 2942549841 scopus 로고
    • L. T. Romankiw, Editor, PV 87-17, The Electrochemical Society Proceedings Series, Pennington, NJ
    • J. Cl. Puippe, in Electrodeposition Technology Theory and Practice, L. T. Romankiw, Editor, PV 87-17, p. 531, The Electrochemical Society Proceedings Series, Pennington, NJ (1987).
    • (1987) Electrodeposition Technology Theory and Practice , pp. 531
    • Puippe, J.Cl.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.