A biaxial probe for nondestructive testing on conductive materials

IEEE Transactions on Instrumentation and Measurement

Volumn 53, Issue 3, 2004, Pages 678-684

  Bernieri, Andrea ^a   Betta, Giovanni ^a   Ferrigno, Luigi ^a   Laracca, Marco ^a  

^a UNIVERSITY OF CASSINO AND SOUTHERN LAZIO   (Italy)

Author keywords

Biaxial probe; Digital signal processing; Eddy current testing; Magnetic transducers; Nondestructive testing (NDT)

Indexed keywords

COMPUTER SIMULATION; DIGITAL SIGNAL PROCESSING; EDDY CURRENT TESTING; MAGNETIC DEVICES; NONDESTRUCTIVE EXAMINATION; POSITION MEASUREMENT; PROBES; TRANSDUCERS;

AUTOMATIC POSITIONING SYSTEMS; BIAXIAL PROBE; CRACK LOCATION; MAGNETIC TRANSDUCERS;

CONDUCTIVE MATERIALS;

EID: 2942607415     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2004.827082     Document Type: Article

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