Non-destructive test by the Hopfield network

Proceedings of the International Joint Conference on Neural Networks

Volumn 6, Issue , 2000, Pages 381-386

  Barcherini, S ^a   Cipiccia, L ^a   Maggi, M ^a   Fiori, S ^a   Burrascano, P ^a  

^a UNIVERSITY OF PERUGIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ASSOCIATIVE PROCESSING; DEFECTS; EDDY CURRENT TESTING;

HOPFIELD NETWORKS; REMOTE FIELD EDDY CURRENT METHOD;

NEURAL NETWORKS;

EID: 0033681935     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ijcnn.2000.859425     Document Type: Conference Paper

References (6)