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Volumn 2, Issue , 2001, Pages 1291-1295
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Improving non-destructive testing probe performance by digital processing techniques
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Author keywords
Digital signal processing; Eddy current testing; Magnetic transducers; Non destructive testing; Soft magnetic materials
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Indexed keywords
ALGORITHMS;
CRACKS;
DIGITAL SIGNAL PROCESSING;
INTERFACES (COMPUTER);
MAGNETIC DEVICES;
MAGNETIC FIELDS;
PERSONAL COMPUTERS;
SOFT MAGNETIC MATERIALS;
DIGITAL PROCESSING ALGORITHMS;
MAGNETIC TRANSDUCER;
ROUGH VOLTAGE DATA;
EDDY CURRENT TESTING;
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EID: 0034835987
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (10)
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References (15)
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