Metrological characterization of an eddy-current-based system for non-destructive testing

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 3, Issue , 2000, Pages 1608-1611

  Bernieri, Andrea ^a   Betta, Giovanni ^a  

^a UNIVERSITY OF CASSINO AND SOUTHERN LAZIO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE MATERIALS; CRACKS; MAGNETIC DEVICES; MAGNETIC FIELD MEASUREMENT; PROBES; SENSORS;

MAGNETIC SENSORS;

EDDY CURRENT TESTING;

EID: 0033688281     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)