Hybrid near-field scanning optical microscopy tips for live cell measurements

Applied Physics Letters

Volumn 84, Issue 19, 2004, Pages 3750-3752

  Kapkiai, Luka K ^a   Moore Nichols, David ^a   Carnell, Jonathan ^a   Krogmeier, Jeffrey R ^a,b   Dunn, Robert C ^a  

^a UNIVERSITY OF KANSAS   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION IMAGING; SPATIAL RESOLUTION; SUBDIFFRACTION LIMITED FLUORESCENCE; TOPOGRAPHIC FEATURES;

ATOMIC FORCE MICROSCOPY; CELLS; DIFFRACTION; ELECTROMAGNETIC FIELDS; FABRICATION; FLUORESCENCE; IMAGING TECHNIQUES; MOLECULAR ORIENTATION; SOLID STATE DEVICES; THIN FILMS;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 2942606530     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1737464     Document Type: Article

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