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Volumn 560, Issue 1-3, 2004, Pages 121-129
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Surface topographic and structural characterization of plasma treated PMAA-PMMA copolymer films
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Author keywords
Atomic force microscopy; Plasma processing; Surface structure, morphology, roughness, and topography
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Indexed keywords
ARGON;
ATOMIC FORCE MICROSCOPY;
COPOLYMERS;
CRACK INITIATION;
KINETIC ENERGY;
METHANOL;
MORPHOLOGY;
PLASMAS;
POLYMETHYL METHACRYLATES;
SURFACE CHEMISTRY;
SURFACE ROUGHNESS;
SURFACE STRUCTURE;
THIN FILMS;
AMPLITUDE ERROR IMAGES (AEI);
PLASMA PROCESSING;
QUADRUPOLE MASS SPECTROMETER (QMS);
ROUGHNESS AND TOPOLOGY;
PLASTIC FILMS;
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EID: 2942576054
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2004.04.033 Document Type: Article |
Times cited : (6)
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References (27)
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