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Volumn 338-340, Issue 1 SPEC. ISS., 2004, Pages 262-265
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An electron-spin-resonance study of laser crystallized polycrystalline silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
CONCENTRATION (PROCESS);
CRYSTALLIZATION;
DOPING (ADDITIVES);
ELECTRON SPIN RESONANCE SPECTROSCOPY;
FERMI LEVEL;
GRAIN BOUNDARIES;
GRAIN SIZE AND SHAPE;
HALL EFFECT;
PARAMAGNETIC RESONANCE;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SECONDARY ION MASS SPECTROMETRY;
CONDUCTION BAND;
DOPING CONCENTRATION;
SPIN DENSITY;
SPIN-LATTICE RELAXATION;
POLYSILICON;
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EID: 2942538104
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2004.02.082 Document Type: Conference Paper |
Times cited : (7)
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References (12)
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