SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 762, Issue , 2003, Pages 69-74

Electron-Spin-Resonance Investigation of Laser Crystallized Polycrystalline Silicon

(4) Brendel, K a Nickel, N H a Lips, K a Fuhs, W a

a HAHN MEITNER INSTITUT (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CARRIER CONCENTRATION; CHEMICAL BONDS; CRYOSTATS; CRYSTALLIZATION; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; ELECTRON SPIN RESONANCE SPECTROSCOPY; GRAIN BOUNDARIES; HIGH TEMPERATURE EFFECTS; LASER BEAM EFFECTS; PASSIVATION; POLYCRYSTALLINE MATERIALS; SINGLE CRYSTALS; VACUUM; X RAY SPECTROMETERS;

CONDUCTION BANDS; GAS FLOW CRYOSTAT;

POLYSILICON;

EID: 1642439005 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: 10.1557/proc-762-a2.3 Document Type: Conference Paper

Times cited : (2)

References (13)

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