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Volumn 338-340, Issue 1 SPEC. ISS., 2004, Pages 178-182
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Polycrystalline silicon obtained by gold metal induced crystallization
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Author keywords
[No Author keywords available]
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Indexed keywords
ACTIVATION ENERGY;
AMORPHOUS SILICON;
ANNEALING;
CHEMICAL VAPOR DEPOSITION;
CRYSTALLIZATION;
DOPING (ADDITIVES);
ELECTRON BEAMS;
ELLIPSOMETRY;
EVAPORATION;
EXCIMER LASERS;
METALLIC FILMS;
X RAY DIFFRACTION ANALYSIS;
EXCIMER LASER ANNEALING (ELA);
METAL INDUCED CRYSTALLIZATION (MIC);
SOLID PHASE CRYSTALLIZATION (SPC);
SPECTROSCOPIC ELLIPSOMETRY (SE);
POLYSILICON;
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EID: 2942527310
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2004.02.048 Document Type: Conference Paper |
Times cited : (26)
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References (11)
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