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Volumn 22, Issue 6, 2003, Pages 903-916

[mü]MAD, the adhesion based dynamic micro-manipulator

Author keywords

Adhesion; Mechanical characterization; Micro manipulation; Micro scale dynamics

Indexed keywords

ADHESION; CANTILEVER BEAMS; CHARACTERIZATION; ELASTIC MODULI; INTERFACIAL ENERGY; PIEZOELECTRIC MATERIALS; SILICON; STIFFNESS; VIBRATIONS (MECHANICAL);

EID: 2942521524     PISSN: 09977538     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0997-7538(03)00071-8     Document Type: Article
Times cited : (56)

References (10)
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  • 2
    • 0003294298 scopus 로고    scopus 로고
    • Manipulation of microscopic objects with nanometer precision: Potentials and limitations in nano-robot design
    • Danuser G., Pappas I., Vgeli B., Zesch W., Dual J. Manipulation of microscopic objects with nanometer precision: potentials and limitations in nano-robot design. Int. J. Robotics Res. 1997.
    • (1997) Int. J. Robotics Res
    • Danuser, G.1    Pappas, I.2    Vgeli, B.3    Zesch, W.4    Dual, J.5
  • 4
    • 33751360590 scopus 로고
    • Adhesion of spheres: The jkr-dmt transition model using a dugdale model
    • Maugis D. Adhesion of spheres: the jkr-dmt transition model using a dugdale model. J. Colloid Interface Sci. 150:1992;243-269.
    • (1992) J. Colloid Interface Sci. , vol.150 , pp. 243-269
    • Maugis, D.1
  • 5
    • 84859720003 scopus 로고    scopus 로고
    • Micromanipulation par adhésion: Modélisation dynamique et expérimentation
    • Rollot Y., Régnier S. Micromanipulation par adhésion: modélisation dynamique et expérimentation. Nano Micro Technol. 1:(2):2000.
    • (2000) Nano Micro Technol. , vol.1 , Issue.2
    • Rollot, Y.1    Régnier, S.2
  • 6
    • 0033077749 scopus 로고    scopus 로고
    • Simulation of micro-manipulations: Adhesion forces and specific dynamic models
    • Rollot Y., Regnier S., Guinot J.-C. Simulation of micro-manipulations: adhesion forces and specific dynamic models. Int. J. Adhesion & Adhesives. 19:1999;35-48.
    • (1999) Int. J. Adhesion & Adhesives , vol.19 , pp. 35-48
    • Rollot, Y.1    Regnier, S.2    Guinot, J.-C.3
  • 7
    • 0035397181 scopus 로고    scopus 로고
    • Voltage required to detach an adhered object particle by coulomb interaction for micromanipulation
    • Takahashi K., Kajihira H., Urago M., Saito S., Mochimaru Y., Onzawa T. Voltage required to detach an adhered object particle by coulomb interaction for micromanipulation. J. Appl. Phys. 90:(1):2001;432-437.
    • (2001) J. Appl. Phys. , vol.90 , Issue.1 , pp. 432-437
    • Takahashi, K.1    Kajihira, H.2    Urago, M.3    Saito, S.4    Mochimaru, Y.5    Onzawa, T.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.