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Volumn , Issue , 2005, Pages 367-370

Low-overhead state-retaining elements for low-leakage MTCMOS design

Author keywords

Leakage Power; MTCMOS Design; State Retention

Indexed keywords

COMPUTER SIMULATION; LEAKAGE CURRENTS; SEQUENTIAL CIRCUITS;

EID: 29244490655     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1057661.1057749     Document Type: Conference Paper
Times cited : (2)

References (5)
  • 1
    • 0031639695 scopus 로고    scopus 로고
    • MTCMOS hierarchical sizing based on mutual exclusive discharge patterns
    • San Francisco, CA, June
    • J. Kao, S. Narendra, A. Chandrakasan, "MTCMOS Hierarchical Sizing based on Mutual Exclusive Discharge Patterns," D AC-35: ACM/IEEE Design Automation Conference, pp. 495-500 San Francisco, CA, June 1998.
    • (1998) D AC-35: ACM/IEEE Design Automation Conference , pp. 495-500
    • Kao, J.1    Narendra, S.2    Chandrakasan, A.3
  • 2
    • 0030290765 scopus 로고    scopus 로고
    • A 1-V multithreshold-voltage CMOS digital signal processor for mobile phone applications
    • S. Mutoh, S. Shigematsu, Y. Matsuya, H. Fukuda, T. Kaneko, "A 1-V Multithreshold-Voltage CMOS Digital Signal Processor for Mobile Phone Applications", IEEE Journal of Solid-State Circuits, vol.31, no.11, pp. 1795-1802, 1996.
    • (1996) IEEE Journal of Solid-state Circuits , vol.31 , Issue.11 , pp. 1795-1802
    • Mutoh, S.1    Shigematsu, S.2    Matsuya, Y.3    Fukuda, H.4    Kaneko, T.5
  • 3
    • 0037686711 scopus 로고    scopus 로고
    • Low-power circuits and technology for wireless digital systems
    • March
    • S.V. Kovosonocky, "Low-Power Circuits and Technology for Wireless Digital Systems", IBM Journal Research and & Development, vol.47, no. 2/3, pp. 1795-1802, March 2003.
    • (2003) IBM Journal Research and & Development , vol.47 , Issue.2-3 , pp. 1795-1802
    • Kovosonocky, S.V.1
  • 4
    • 3042660389 scopus 로고    scopus 로고
    • Sizing and characterization of leakage-control cells for layout-aware distributed power-gating
    • Paris, France, February
    • P. Babighian, L. Benini, E. Macii, "Sizing and Characterization of Leakage-Control Cells for Layout-Aware Distributed Power-Gating", DATE-04: IEEE 2004 Design Automation and Test in Europe, pp. 720-721, Paris, France, February 2004.
    • (2004) DATE-04: IEEE 2004 Design Automation and Test in Europe , pp. 720-721
    • Babighian, P.1    Benini, L.2    Macii, E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.