Microplasma breakdown in high-concentration III-V solar cells

IEEE Electron Device Letters

Volumn 26, Issue 12, 2005, Pages 867-869

  González, José Ramón ^a   Rey Stolle, Ignacio ^a   Algora, Carlos ^a   Galiana, Beatriz ^a  

^a INSTITUTO DE ENERGÍA SOLAR   (Spain)

Author keywords

Gallium compounds; Manufacturing testing; Optoelectronic devices; Photovoltaic cell fabrication; Photovoltaics cells; Semiconductor device breakdown

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DEGRADATION; ELECTRIC BREAKDOWN; ION IMPLANTATION; OPTOELECTRONIC DEVICES; PHOTOVOLTAIC CELLS; RELIABILITY; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR PLASMAS;

DEVICE DEGRADATION; MANUFACTURING TESTING; MICROPLASMA BREAKDOWN; PHOTOVOLTAIC CELL FABRICATION; SEMICONDUCTOR DEVICE BREAKDOWN;

SOLAR CELLS;

EID: 29244460416     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2005.859626     Document Type: Article

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