Chirped arrays of refractive ellipsoidal microlenses for aberration correction under oblique incidence

Optics Express

Volumn 13, Issue 26, 2005, Pages 10539-10557

  Duparré, Jacques ^a   Wippermann, Frank ^a   Dannberg, Peter ^a   Reimann, Andreas ^a  

^a FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ARRAYS; MASKS; OPTICAL RESOLVING POWER; PHOTOLITHOGRAPHY; PHOTORESISTORS;

ASTIGMASTISM; CHIRPED ARRAYS; GULLSTRAND'S EQUATIONS; OBLIQUE INCIDENCE;

MICROLENSES;

EID: 29244438783     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.010539     Document Type: Article

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