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Journal De Physique. IV : JP

Volumn 103, Issue , 2003, Pages 321-337

Microstructure and X-ray diffraction line profile;Microstructure et profil des raies de diffraction des rayons X

a Laboratoire de Chimie du Solide et Inorganique Moleculaire de Rennes (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 29144533806 PISSN: 11554339 EISSN: 17647177 Source Type: Conference Proceeding
DOI: 10.1051/jp4:200300013 Document Type: Article

Times cited : (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.