Growth and characterization of dual-beam pulsed-laser-deposited Zn 1-x Co xO thin films

Journal of Applied Physics

Volumn 98, Issue 11, 2005, Pages

  Peng, Y Z ^a,b   Liew, T ^a,b   Chong, T C ^a,b   Song, W D ^a   Li, H L ^b   Liu, W ^b  

^a DATA STORAGE INSTITUTE   (Singapore)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

GROWTH TENPERATURE; HALL MOBILITY; LASER DEPOSITION; SEMICONDUCTOR PROPERTIES;

CARRIER CONCENTRATION; CRYSTAL STRUCTURE; EPITAXIAL GROWTH; FILM GROWTH; HYSTERESIS; MAGNETIC PROPERTIES; SEMICONDUCTOR DOPING; SINGLE CRYSTALS;

THIN FILMS;

EID: 29144533296     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2060938     Document Type: Article

References (26)

1. S. J. Pearton, J. Appl. Phys. 93, 1 (2003).
2. T. Fukumura, Y. Yamada, H. Toyosaki, T. Hasegawa, H. Koinuma, and M. Kawasaki, Appl. Surf. Sci. 223, 62 (2004).
3. H. Ohno, A. Shen, F. Matsukura, A. Oiwa, A. Endo, S. Katsumoto, and Y. Lye, Appl. Phys. Lett. 69, 363 (1996).
4. P. P. Chen, H. Makino, J. J. Kim, and T. Yao, J. Cryst. Growth 251, 331 (2003).
5. Z. Jin, M. Murakami, T. Fukumura, Y. Matsumoto, A. Ohtomo, M. Kawasaki, and H. Koinuma, J. Cryst. Growth 214, 55 (2000).
6. A. Tiwari, C. Jin, A. Kvit, D. Kumar, J. F. Muth, and J. Narayan, Solid State Commun. 121, 371 (2002).
7. T. Wakano, N. Fujimura, Y. Morinaga, N. Abe, A. Ashida, and T. Ito, Physica E (Amsterdam) 10, 260 (2001).
8. A. Ohtomo, Appl. Phys. Lett. 72, 2466 (1998).
9. S. G. Yang, A. B. Pakhomov, S. T. Hung, and C. Y. Wong, IEEE Trans. Magn. 38, 2877 (2002).
10. Y. M. Kim, M. Yoon, I.-W. Park, Y. J. Park, and J. H. Lyou, Solid State Commun. 129, 175 (2004).
11. K. Ueda, H. Tabata, and T. Kawai, Appl. Phys. Lett. 79, 988 (2001).
12. Z. W. Jin, Appl. Phys. Lett. 78, 3824 (2001).
13. J.-H. Kim, H. Kim, D. Kim, Y.-E. Ihm, and W.-K. Choo, J. Appl. Phys. 92, 6066 (2002).
14. Z. Yin, N. Chen, C. Chai, and F. Yang, J. Appl. Phys. 96, 5093 (2004).
15. J. H. Park, M. G. Kim, H. M. Jang, S. W. Ryu, and Y. M. Kim, Appl. Phys. Lett. 84, 1338 (2004).
16. C. K. Ong, S. Y. Xu, and W. Z. Zhou, Rev. Sci. Instrum. 69, 3659 (1998).
17. N. L. Peterson, in Solid State Physics, edited by, F. Seitz, D. Turnbull, and, H. Ehrenreich, (Academic, New York, 1968), Vol. 22, p. 409.
18. D. L. Smith, Thin Film Deposition: Principles and Practice (McGraw-Hill, New York, 1995), Chap., p. 119.
19. Y. Z. Peng, Appl. Phys. A: Mater. Sci. Process. 80, 565 (2005).
20. Y. Z. Peng, T. Liew, W. D. Song, C. W. An, K. L. Teo, and T. C. Chong, J. Supercond. 18, 97 (2005).
21. J. F. Moulder, W. F. Stickle, P. E. Sobol, and K. D. Bomben, in Handbook of X-ray Photoelectron Spectroscopy: A Reference Book of Standard Spectra for Identification and Interpretation of XPS Data, edited by, J. Chastain, and, R. C. King, Jr., (Physical Electronics, Inc., Eden Prairie, MN, 1995), Chap., p. 82.
22. D. P. Norton, S. J. Pearton, A. F. Hebard, N. Theodoropoulou, L. A. Boatner, and R. G. Wilson, Appl. Phys. Lett. 82, 239 (2003).
23. H. Ohno, H. Munekata, T. Penney, S. von Molnar, and L. L. Chang, Phys. Rev. Lett. 68, 2664 (1992).
24. J. A. Mydosh, An Experimental Introduction to Spin Glass (Taylor and Francis, London, 1993).
25. C. T. Sah, Fundamentals of Solid State Electronics (World Scientific, Singapore, 1991), Chap., p. 232.
26. B. I. Shklovskii and A. L. Efros, Electronic Properties of Doped Semiconductors (Springer, Berlin, 1984), Chaps. and.