An inelastic X-ray spectrometer with 2.2 meV energy resolution

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 467-468, Issue PART II, 2001, Pages 1545-1548

  Sinn, H ^a   Alp, E E ^a   Alatas, A ^a   Barraza, J ^a   Bortel, G ^a   Burkel, E ^b   Shu, D ^a   Sturhahn, W ^a   Sutter, J P ^a   Toellner, T S ^a   Zhao, J ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF ROSTOCK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

SINGLE CRYSTALS; SPECTROMETERS; X RAY SCATTERING; X RAY SPECTROMETERS;

ADVANCED PHOTON SOURCE; BACKSCATTERING GEOMETRY; ENERGY RESOLUTIONS; INELASTIC X RAY SCATTERING; MONOCHROMATIZATION; NESTED STRUCTURES; SCATTERING GEOMETRIES; TWO DIMENSIONAL FOCUSING;

FORWARD SCATTERING;

EID: 1642433153     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00755-0     Document Type: Article

References (7)

1. F. Sette et al., Science 280 (1998) 1550.
2. H. Sinn et al., Phys. Rev. Lett. 78 (1997) 171.
3. E. Burkel, Rep. Prog. Phys. 63 (2000) 171.
4. T. S. Toellner Hyperfine Interactions 125 (2000) 3-28.
5. T. M. Mooney et al., EPICS and its role in data acquisition and beamline control, in: P. Pianetta et al. (Eds.), Synchrotron Radiation Instrumentation (SRI99), Woodbury, NY, American Institute of Physics, 2000.
6. C. Masciovecchio et al., Nucl. Instr. and Meth. B 111 (1996) 181.
7. R. Stedman et al., J. Phys. F 6 (1976) 157.