Silicon carbide for alpha, beta, ion and soft X-ray high performance detectors

Materials Science Forum

Volumn 483-485, Issue , 2005, Pages 1015-1020

  Bertuccio, G ^a,b   Binetti, S ^c   Caceia, S ^a,b   Casiraghi, R ^a,b   Castaldini, A ^d   Cavallini, A ^d   Lanzieri, C ^e   Le Donne, A ^c   Nava, F ^f   Pizzini, S ^c   Rigutti, L ^d   Verzellesi, G ^f   Vittone, E ^g  

^a POLITECNICO DI MILANO   (Italy)

^b INFN SEZIONE DI MILANO   (Italy)

^c UNIVERSITY OF MILANO BICOCCA   (Italy)

^d UNIVERSITY OF BOLOGNA   (Italy)

^e ALENIA SPAZIO   (Italy)

^f UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^g UNIVERSITY OF TURIN   (Italy)

Author keywords

Radiation detector; Radiation spectroscopy; X ray spectroscopy

Indexed keywords

EPITAXIAL LAYERS; IONIZING RADIATION; LEAKAGE CURRENTS; RADIATION DETECTORS; RADIATION HARDENING;

CHARGE COLLECTION EFFICIENCY; RADIATION SPECTROSCOPY; SCHOTTKY JUNCTIONS; X-RAY SPECTROSCOPY;

SILICON CARBIDE;

EID: 29144473593     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-963-6.1015     Document Type: Conference Paper

References (7)

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