Characterisation of SiC by IBIC and other IBA techniques

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 188, Issue 1-4, 2002, Pages 130-134

  Jaksi M ^a   Bosnjak I ^a   Gracin, D ^a   Meduni, Z ^a   Pastuovi, I ^a   Vittone, E ^b   Nava, F ^c  

^a RUDER BO KOVI INSTITUTE   (Croatia)

^b UNIVERSITY OF TURIN   (Italy)

^c UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; COMPUTER SIMULATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; ION BEAMS; PARTICLE DETECTORS; PROTON BEAMS; RAMAN SPECTROSCOPY; SINGLE CRYSTALS; STOICHIOMETRY;

STRUCTURAL ORDERING;

SILICON CARBIDE;

EID: 0036535590     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)01061-8     Document Type: Conference Paper

References (18)