Stamp collapse in soft lithography

Langmuir

Volumn 21, Issue 17, 2005, Pages 8058-8068

  Huang, Yonggang Y ^a   Zhou, Weixing ^a   Hsia, K J ^a   Menard, Etienne ^a,b   Park, Jang Ung ^a   Rogers, John A ^a   Alleyne, Andrew G ^a  

^a University of Illinois at Urbana Champaign   (United States)

^b SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ROOF COLLAPSE; SOFT LITHOGRAPHY; STAMP COLLAPSE;

ADHESION; DATA ACQUISITION; ELASTICITY; STAMPING;

LITHOGRAPHY;

EID: 29144450768     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0502185     Document Type: Article

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