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Volumn 23, Issue 6, 2005, Pages 2806-2810

Cross beam lithography (FIB+EBL) and dip pen nanolithography for nanoparticle conductivity measurements

Author keywords

[No Author keywords available]

Indexed keywords

DIP PEN NANOLITHOGRAPHY; GOLD SURFACES; GOLD WIRE; RESISTLESS TECHNIQUE;

EID: 29044444112     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2062647     Document Type: Article
Times cited : (14)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.