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Volumn 23, Issue 6, 2005, Pages 2806-2810
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Cross beam lithography (FIB+EBL) and dip pen nanolithography for nanoparticle conductivity measurements
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Author keywords
[No Author keywords available]
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Indexed keywords
DIP PEN NANOLITHOGRAPHY;
GOLD SURFACES;
GOLD WIRE;
RESISTLESS TECHNIQUE;
ALCOHOLS;
ATOMIC FORCE MICROSCOPY;
ELECTRIC CONDUCTIVITY;
ELECTRIC VARIABLES MEASUREMENT;
FOCUSING;
GOLD;
ION BEAMS;
NANOSTRUCTURED MATERIALS;
NANOTECHNOLOGY;
OPTICAL RESOLVING POWER;
SUBSTRATES;
ELECTRON BEAM LITHOGRAPHY;
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EID: 29044444112
PISSN: 10711023
EISSN: None
Source Type: Journal
DOI: 10.1116/1.2062647 Document Type: Article |
Times cited : (14)
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References (15)
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