The use of a special work station for in situ measurements of highly reactive electrochemical systems by atomic force and scanning tunneling microscopes

Review of Scientific Instruments

Volumn 70, Issue 12, 1999, Pages 4668-4675

  Cohen, Yair ^a   Aurbach, Doron ^a  

^a BAR ILAN UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000970004     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150130     Document Type: Article

References (11)

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