Nanorheology mapping by atomic force microscopy

Kobunshi Ronbunshu

Volumn 62, Issue 10, 2005, Pages 476-487

  Nakajima, Ken ^a   Fujinami, So ^a   Nukaga, Hideyuki ^a   Watabe, Hiroyuki ^a   Kitano, Hiroki ^a   Ono, Naoto ^a   Endoh, Katsuyoshi ^a   Kaneko, Mie ^a   Nishi, Toshio ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Atomic force microscopy; Force modulation; Force distance curve; Nanorheology mapping; Sample deformation; Tapping mode

Indexed keywords

DEFORMATION; ELASTIC MODULI; IMAGING TECHNIQUES; MECHANICAL PROPERTIES; POLYMER BLENDS; RUBBER; THREE DIMENSIONAL;

FORCE MODULATION TECHNIQUE; FORCE-DISTANCE CURVE; NANORHEOLOGY MAPPING; SAMPLE DEFORMATION; TAPPING MODE;

ATOMIC FORCE MICROSCOPY;

RHEOLOGY;

EID: 28844489523     PISSN: 03862186     EISSN: None     Source Type: Journal    
DOI: 10.1295/koron.62.476     Document Type: Article

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