Charge distribution at interface and in bulk of YSZ thin films deposited on Si substrate

Ceramics International

Volumn 32, Issue 2, 2006, Pages 105-109

  Gmucova K ^a   Hartmanova M ^a   Kundracik, F ^b  

^a INSTITUTE OF PHYSICS   (Slovakia)

^b Faculty of Natural Sciences   (Slovakia)

Author keywords

B. Interface; Bulk; Charge transient methods; Impedance spectroscopy; Polycrystalline structure; Thin film; Yttria stabilized zirconia

Indexed keywords

CHARGE CARRIERS; CRYSTAL STRUCTURE; DEPOSITION; INTERFACES (MATERIALS); POLYCRYSTALLINE MATERIALS; SILICON; SPECTROSCOPIC ANALYSIS; SUBSTRATES; THIN FILMS;

BULK; CHARGE TRANSIENT METHODS; IMPEDANCE SPECTROSCOPY; INTERFACES; POLYCRYSTALLINE STRUCTURE; YTTRIA-STABILIZED ZIRCONIA;

YTTRIUM COMPOUNDS;

EID: 28844473486     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2005.01.004     Document Type: Article

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