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Materials Science and Engineering: B

Volumn 84, Issue 3, 2001, Pages 167-175

Ohmic resistance of thin yttria stabilized zirconia film and electrode-electrolyte contact area

(6) Kundracik, F a Hartmanova M b Mullerova J c Jergel, M b Kostic I d Tucoulou, R e

a Physics and Informatics (Slovakia)

b INSTITUTE OF PHYSICS (Slovakia)

c Military Academy of Slovakia (Slovakia)

d INSTITUTE OF INFORMATICS (Slovakia)

e CNRS (France)

Author keywords

Electrode electrolyte contact area; Extinction coefficient; Ohmic resistance; Packing density; Refractive index; Zirconia films

Indexed keywords

AMORPHOUS FILMS; CONDUCTIVE FILMS; CRYSTAL STRUCTURE; ELECTRODES; ELECTROLYTES; GRAIN SIZE AND SHAPE; OHMIC CONTACTS; POLYCRYSTALLINE MATERIALS; THIN FILMS; YTTRIUM COMPOUNDS;

YTTRIA;

ZIRCONIA;

EID: 0035919999 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-5107(01)00515-3 Document Type: Article

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