X-ray microanalysis of real materials using Monte Carlo simulations

Surface and Interface Analysis

Volumn 37, Issue 11, 2005, Pages 875-886

  Gauvin, Raynald ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

SEM; VP SEM Monte Carlo simulations; X ray microanalysis

Indexed keywords

COMPUTER SIMULATION; MONTE CARLO METHODS; SCANNING ELECTRON MICROSCOPY; X RAY ANALYSIS;

VP-SEM MONTE CARLO SIMULATIONS; X-RAY MICROANALYSIS;

POROUS MATERIALS;

EID: 28744438727     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.2105     Document Type: Conference Paper

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