Thermal diffusivity measurement of a thin metal film with a picosecond thermoreflectance technique

High Temperatures - High Pressures

Volumn 34, Issue 1, 2002, Pages 19-28

  Taketoshi, Naoyuki ^a   Baba, Tetsuya ^a   Ono, Akira ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

PICOSECOND THERMOREFLECTANCE TECHNIQUE;

ALUMINUM; HEATING; SUBSTRATES; THERMAL VARIABLES MEASUREMENT; THIN FILMS;

THERMAL DIFFUSION IN SOLIDS;

EID: 0036001781     PISSN: 00181544     EISSN: None     Source Type: Journal    
DOI: 10.1068/htwu125     Document Type: Article

References (13)