Simulation of lossy package transmission lines using extracted data from one-port TDR measurements and nonphysical RLGC models

IEEE Transactions on Advanced Packaging

Volumn 28, Issue 4, 2005, Pages 736-744

  Kim, Woopoung ^a,b   Swaminathan, Madhavan ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b RAMBUS INC   (United States)

Author keywords

Characteristic impedance; Frequency dependence; Nonphysical RLGC model; Propagation constant; Time domain reflectometry (TDR); Transmission line

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; ELECTRIC CONDUCTANCE; ELECTRIC IMPEDANCE; ELECTRIC RESISTANCE; INDUCTANCE; REFLECTOMETERS;

CHARACTERISTIC IMPEDANCE; FREQUENCY DEPENDENT CHARACTERISTIC IMPEDANCE; PROPAGATION CONSTANT; TIME DOMAIN REFLECTOMETRY (TDR);

TRANSMISSION LINE THEORY;

EID: 28444461845     PISSN: 15213323     EISSN: None     Source Type: Journal    
DOI: 10.1109/TADVP.2005.849563     Document Type: Article

References (17)

1. R. A. Chipman, Schaum's Outline of Theory and Problems of Transmission Line. New York: McGraw-Hill, 1968.
2. R. Nozaki and T. K. Bose, "Broadband complex permittivity measurements by time-domain spectroscopy," IEEE Trans. Instrum. Meas., vol. 39, no. 6, pp. 945-951, Dec. 1990.
3. L. A. Hayden and V. K. Tripathi, "Calibration methods for time-domain network analysis," IEEE Trans. Microw. Theory Tech., vol. 41, no. 3, pp. 415-420, Mar. 1993.
4. J. M. Jong, V. K. Tripathi, L. A. Hayden, and B. Janko, "Lossy interconnect modeling from TDR/T measurements," in Proc. IEEE 3rd Topical Meeting Electrical Performance of Electronic Packaging, Nov. 1994, pp. 133-135.
5. S. Pannala and M. Swaminathan, "Extraction of S-parameters from TDR/ TDT measurements using rational functions," in Proc. 54th ARFTG Conf. Dig., 1999, pp. 45-52.
6. A. Deutsch et al., "Frequency-dependent losses on high-performance interconnections," IEEE Trans. Electromagn. Compat., vol. 43, no. 4, pp. 446-465, Nov. 2001.
7. D. Oh, "Accurate transient simulation of transmission lines with the skin effect," IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst., vol. 19, no. 3, pp. 389-396, Mar. 2000.
8. Star-Hspice Manual, 2001. 2 ed., Avant!, 2001, pp. 18-27.
9. P. Ferrari and G. Angenieux, "Calibration of a time-domain network analyzer: A new approach," IEEE Trans. Instrum. Meas., vol. 49, no. 1, pp. 178-187, Feb. 2000.
10. W. Kim, "Development of measurement-based time-domain models and its application to wafer level packaging," Ph.D. dissertation, School Electrical Computer Engineering, Georgia Institute of Technology, Atlanta, GA, 2004.
11. "Automating the HP 8410B Microwave Network Analyzer," Hewlett-Packard, Application Note 221A, 1980.
12. W. Kim, S. H. Lee, M. Swaminathan, and R. R. Tummala, "Robust extraction of the frequency-dependent characteristic impedance of transmission lines using one-port TDR measurements," in Proc. IEEE 10th Topical Meeting Electrical Performance Electronic Packaging, Oct. 2001, pp. 113-116.
13. D. F. Williams and B. K. Alpert, "Characteristic impedance of microstrip on silicon," Proc. IEEE Electrical Performance Electrical Packaging, pp. 25-27, Oct. 1999.
14. W. Kim, S. H. Lee, M. C. Seo, M. Swaminathan, and R. R. Tummala, "Determination of propagation constants of transmission lines using 1-port TDR measurements," in Proc. 59th ARFTG Conf. Dig., Jun. 2002, pp. 119-124.
15. W. Kim and M. Swaminathan, "Validity of nonphysical RLGC models for simulating lossy transmission lines," in Proc. IEEE Int. Symp. Antennas Propagation Society, vol. 3, 2002, pp. 786-789.
16. D. M. Pozar, Microwave Engineering, 2nd ed. New York: Wiley, 1998.
17. W. Kim and M. Swaminathan, "Characterization of co-planar silicon transmission lines with and without slow-wave effect," in Proc. IEEE 13th Topical Meeting Electrical Performance Electronic Packaging, Oct. 2004, pp. 21-24.