Robust extraction of the frequency-dependent characteristic impedance of transmission lines using one-port TDR measurements

IEEE Topical Meeting on Electrical Performance of Electronic Packaging

Volumn , Issue , 2001, Pages 113-116

  Kim, Woopoung ^a   Lee, Seock Hee ^a   Swaminathan, Madhavan ^a   Tummala, Rao R ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CAPACITORS; COMPUTER SIMULATION; DIELECTRIC MATERIALS; ELECTRIC INDUCTORS; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK ANALYZERS; INDUCTANCE; MATHEMATICAL MODELS; MICROSTRIP LINES; PRINTED CIRCUIT BOARDS; WAVEGUIDES;

FREQUENCY DEPENDENT CHARACTERISTIC IMPEDANCE; FREQUENCY DEPENDENT PAD PARASITICS; TIME DOMAIN REFLECTOMETRY;

ELECTRIC IMPEDANCE MEASUREMENT;

EID: 0035699154     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

1. A multi-line method of network analyzer calibration
2. Extraction of S-parameters from TDR/TDT measurements using rational functions
3. High-speed interconnection characterization using time domain network analysis
4. Sources of error in coplanar-waveguide TRL calibrations
5. Characteristic impedance determination using propagation constant measurement
6. A new method for characteristic impedance determination on lossy substrate
7. Accurate characteristic impedance measurement on silicon
8. Extraction of the frequency-dependent characteristic impedance of transmission lines using TDR measurements
9. Automating the HP 8410B microwave network analyzer
10. A hybrid method for the calculation of the resistance and inductance of transmission lines with arbitrary cross sections
11. Internal inductance and conductor loss associated with the ground plane of a microstrip line