Extraction of S-parameters from TDR/TDT measurements using rational functions

54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999

Volumn , Issue , 1999, Pages

  Pannala, Sreemala ^a   Swaminathan, Madhavan ^b  

^a SUN MICROSYSTEMS   (United States)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXTRACTION; MICROWAVE MEASUREMENT; PARAMETER ESTIMATION; PRINTED CIRCUIT BOARDS; SCATTERING PARAMETERS; THIN FILM CIRCUITS;

BROAD BANDS; FILM PLANES; GENERALIZED PENCIL-OF-FUNCTION METHODS; LOW-LOSS; NETWORK ANALYZER MEASUREMENT; REFLECTION AND TRANSMISSION; SPICE-COMPATIBLE; TDR/TDT;

RATIONAL FUNCTIONS;

EID: 85013878952     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1999.327362     Document Type: Conference Paper

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