Ferroelectric properties of sol-gel derived Ca modified PbZr 0.52Ti0.48O3 films

Applied Physics Letters

Volumn 87, Issue 13, 2005, Pages 1-3

  Ezhilvalavan, S ^a   Samper, Victor D ^a  

^a INSTITUTE OF BIOENGINEERING AND NANOTECHNOLOGY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM; CURRENT DENSITY; LEAD COMPOUNDS; LEAKAGE CURRENTS; POLARIZATION; SCANNING ELECTRON MICROSCOPY; SOL-GELS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC PROPERTIES; SWITCHING CYCLES;

FERROELECTRICITY;

EID: 28344447304     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2041820     Document Type: Article

References (16)

1. J. F. Scott and C. A. Paz de Arajuo, Science 246, 1400 (1989).
2. P. Muralt, M. Kohli, T. Maeder, A. Kholkin, K. Brooks, N. Setter, and R. Luthier, Sens. Actuators, A 48, 157 (1995).
3. H. D. Chen, K. R. Udayakumar, C. J. Gaskey, and L. E. Cross, Appl. Phys. Lett. 67, 3411 (1995).
4. A. L. Kholkin, M. L. Cazada, P. Ramos, J. Mendiola, and N. Setter, Appl. Phys. Lett. 69, 3602 (1996).
5. K. Okazaki, Ferroelectrics 41, 77 (1981).
6. Y. Yamashita, K. Yokoyama, H. Honda, and T. Takahashi, J. Appl. Phys. 20, 183 (1981).
7. D. Damjanovic, T. R. Gururaja, and L. E. Cross, Am. Ceram. Soc. Bull. 66, 699 (1987).
8. W. Wersing, K. Lubitz, and J. Mohaupt, IEEE Trans. Ultrason. Ferroelectr. Freq. Control 36, 424 (1989).
9. A. Seifert, L. Sagelowicz, P. Muralt, and N. Setter, J. Mater. Res. 14, 2012 (1999).
10. H. Huang, Z. Tianshu, J. T. Oh, and P. Hing, Ferroelectrics 274, 55 (2002).
11. Y. Ushida, J. Lian, T. Shiosaki, and A. Kawabata, Jpn. J. Appl. Phys., Suppl. 26-2, 72 (1987).
12. M. Adachi, A. Haisuka, N. Okumura, T. Shiosaki, and A. Kawabata, Jpn. J. Appl. Phys., Suppl. 26-2, 68 (1987).
13. R. Clarke and A. M. Glazer, Ferroelectrics 11, 359 (1976).
14. H. Huang, C. Q. Sun, Z. Tianshu, and P. Hing, Phys. Rev. B 63, 184112 (2001).
15. S. Ezhilvalavan and V. Samper, Appl. Phys. Lett. 86, 072901 (2005).
16. S. Ezhilvalavan, V. Samper, T. W. Seng, J. M. Xue, and J. Wang, J. Appl. Phys. 96, 2181 (2004).