Microstructural evolution of dense and porous pyroelectric Pb1-xCaxTiO3 thin films

Journal of Materials Research

Volumn 14, Issue 5, 1999, Pages 2012-2022

  Seifert, Andreas ^a   Sagalowicz, Laurent ^a   Murait, Paul ^a   Setter, Nava ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; DEPOSITION; LEAD COMPOUNDS; NUCLEATION; PERMITTIVITY; RAPID THERMAL ANNEALING; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

DENSE FILM; POROUS FILM; PYROELECTRIC THIN FILM;

DIELECTRIC FILMS;

EID: 0032664811     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1999.0272     Document Type: Article

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