On-wafer calibration algorithm for partially leaky multiport vector network analyzers

IEEE Transactions on Microwave Theory and Techniques

Volumn 53, Issue 11, 2005, Pages 3665-3671

  Teppati, Valeria ^a,b   Ferrero, Andrea ^a,b  

^a IEEE   (Italy)

^b POLITECNICO DI TORINO   (Italy)

Author keywords

Leaky calibration; Leaky error model; Multiport calibration; Multiport error model; Multiport S parameters; Multiport vector network analyzer (VNA); On wafer calibration

Indexed keywords

LEAKY CALIBRATION; LEAKY ERROR MODELS; MULTIPORT CALIBRATION; MULTIPORT ERROR MODELS; MULTIPORT S-PARAMETERS; MULTIPORT VECTOR NETWORK ANALYZERS (VNA); ON-WAFER CALIBRATION;

ALGORITHMS; CODES (STANDARDS); COMPUTER SIMULATION; CROSSTALK; ERROR ANALYSIS; ERRORS; MATHEMATICAL MODELS; PROBES; VECTORS;

ANALOG DIFFERENTIAL ANALYZERS;

EID: 28144455903     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2005.857100     Document Type: Conference Paper

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