Multiport scattering matrix measurement using a reduced-port network analyzer

IEEE Transactions on Microwave Theory and Techniques

Volumn 51, Issue 5, 2003, Pages 1525-1533

  Lu, Hsin Chia ^a   Chu, Tah Hsiung ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

Multiport network; Scattering matrix measurement

Indexed keywords

REFLECTION; SCATTERING; VECTORS;

MULTIPORT NETWORKS;

ELECTRIC NETWORK ANALYZERS;

EID: 0038394570     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2003.810134     Document Type: Article

References (15)

1. R. A. Speciale, "Multi-port network analyzers meeting the design need," Microwave Syst. News., vol. 10, no. 6, pp. 67-89, June 1980.
2. A. Ferrero, U. Pisani, and K. J., Kerwin, "A new implementation of a multi-port automatic network analyzer," IEEE Trans. Microwave Theory Tech., vol. 40, pp. 2078-2085, Nov. 1992,
3. A. Ferrero, F. Sanpietro, and U. Pisani, "Accurate coaxial standard verification by multiport vector network analyzer," in IEEE MTT-S Int. Microwave Symp. Dig., May 1994, pp. 1365-1368.
4. A. Ferrero and F. Sanpietro, "A simplified algorithm for leaky network analyzer calibration," IEEE Microwave Guided Wave Lett., vol. 5, pp. 119-121, Apr. 1995.
5. R. A. Speciale, "A generalization of the TSD network-analyzer calibration procedure, covering n-port scattering matrix measurements," IEEE Trans. Microwave Theory Tech., vol. MTT-25, pp, 1100-1115, Dec. 1977,
6. J. V. Butler et al., "16-term error model and calibration procedure for on-wafer network analysis measurements," IEEE Trans. Microwave Theory Tech., vol. 39, pp. 2211-2217, Dec. 1991.
7. H. Van Hamme and M. Vanden Bossche, "Flexible vector analyzer calibration with accuracy bounds using an 8-term or 16-term error correction model," IEEE Trans. Microwave Theory Tech., vol. 42, pp. 976-987, June 1994.
8. H. Heuerman and B. Schiek, "Results of NWA measurements with leakage errors corrected with the TMS-15 term procedures," in IEEE MTT-S Int. Microwave Symp. Dig., May 1994, pp. 1361-1364.
9. J. C. Tippet and R. A. Speciale, "A rigorous technique for measuring the scattering matrix of a multi-port device with a two-port network analyzer," IEEE Trans. Microwave Theory Tech., vol. MTT-30, pp. 661-666, May 1982,
10. H. Dropkin, "Comments on 'A rigorous technique for measuring the scattering matrix of a multi-port device with a two-port network analyzer'," IEEE Trans. Microwave Theory Tech., vol. MTT-31, pp. 79-81, Jan. 1983.
11. S. Sercu and L. Martens, "Characterizing n-port packages and interconnections with a 2-port network analyzer," in IEEE 6th Electrical Performance of Electronic Packaging Topical Meeting Dig., Oct. 1997, pp. 163-166,
12. D. Woods, "Multi-port-network analysis by matrix renormalization employing voltage-wave S-parameters with complex normalization," Proc. Inst. Elect. Eng., vol. 124, no. 3, pp, 198-204, Mar. 1977.
13. D. F. Williams and D. K. Walker, "In-line multiport calibration," in 51st ARFTG Dig., June 1998, pp. 88-90.
14. W. Lin and C. Ruan, "Measurement and calibration of a universal six-port network analyzer," IEEE Trans. Microwave Theory Tech., vol. 37, pp, 734-742, Apr. 1989.
15. H. C. Lu and T. H. Chu, "Port reduction methods for scattering matrix measurement of an N-port network," IEEE Trans. Microwave Theory Tech., vol. 48, pp. 959-968, June 2000.