Uncertainties associated with many-port (>4) S-parameter measurements using a four-port vector network analyzer

IEEE Transactions on Microwave Theory and Techniques

Volumn 52, Issue 5, 2004, Pages 1361-1368

  Martens, J ^a   Judge, David V ^a   Bigelow, Jimmy A ^a  

^a Anritsu Company USA   (United States)

Author keywords

Multiport network analysis; S parameter measurement; Uncertainties

Indexed keywords

ALGORITHMS; CALIBRATION; ELECTRIC IMPEDANCE; ELECTRIC NETWORK ANALYZERS; MATRIX ALGEBRA; OPTIMIZATION; SWITCHING; VECTORS;

MULTIPORT NETWORK ANALYSIS; S-PARAMETER MEASUREMENTS; UNCERTAINTIES;

MICROWAVES;

EID: 2542497818     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2004.826997     Document Type: Article

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