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Volumn 37, Issue 4, 1989, Pages 734-742

Measurement and Calibration of a Universal Six-Port Network Analyzer

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORKS--ANALYSIS; MEASUREMENT THEORY; MICROWAVE MEASUREMENTS;

EID: 0024647372     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.18847     Document Type: Article
Times cited : (24)

References (16)
  • 1
    • 0015433792 scopus 로고
    • The six-port couplex: A new approach to measuring voltage, current, power, impedance, and phase
    • Dec.
    • C. A. Hoer, “The six-port couplex: A new approach to measuring voltage, current, power, impedance, and phase,” IEEE Trans. Instrum. Meas., vol. IM-21, pp. 466-470, Dec. 1972.
    • (1972) IEEE Trans. Instrum. Meas. , vol.IM-21 , pp. 466-470
    • Hoer, C.A.1
  • 2
    • 0015434742 scopus 로고
    • Application of an arbitrary b-port junction to power measurement problems
    • Dec.
    • G. F. Engen and C. A. Hoer, “Application of an arbitrary b-port junction to power measurement problems,” IEEE Trans. Instrum. Meas., vol. IM-21, pp. 470-474, Dec. 1972.
    • (1972) IEEE Trans. Instrum. Meas. , vol.IM-21 , pp. 470-474
    • Engen, G.F.1    Hoer, C.A.2
  • 3
    • 0017678195 scopus 로고
    • A network analyzer incorporating two six-port reflectometers
    • Dec.
    • C. A. Hoer, “A network analyzer incorporating two six-port reflectometers,” IEEE Trans. Microwave Theory Tech., vol. MTT-25, pp. 1070-1074, Dec. 1977.
    • (1977) IEEE Trans. Microwave Theory Tech. , vol.MTT-25 , pp. 1070-1074
    • Hoer, C.A.1
  • 4
    • 0018720739 scopus 로고
    • Thru-reflect-line an improved technique for calibrating the dual-six-port automatic network analyzer
    • Dec.
    • G. F. Engen and C. A. Hoer, “Thru-reflect-line an improved technique for calibrating the dual-six-port automatic network analyzer,” IEEE Trans. Microwave Theory Tech., vol. MTT-27, pp. 987-992, Dec. 1979.
    • (1979) IEEE Trans. Microwave Theory Tech. , vol.MTT-27 , pp. 987-992
    • Engen, G.F.1    Hoer, C.A.2
  • 5
    • 0019559606 scopus 로고
    • A dual six-port automatic network analyzer
    • Apr.
    • H. M. Cronson and L. Susman, “A dual six-port automatic network analyzer,” IEEE Trans. Microwave Theory Tech., vol. MTT-29, pp. 372-378, Apr. 1981.
    • (1981) IEEE Trans. Microwave Theory Tech. , vol.MTT-29 , pp. 372-378
    • Cronson, H.M.1    Susman, L.2
  • 6
    • 84941607322 scopus 로고
    • A new method for calibrating dual six-port network analyzers and for measuring two-port devices
    • Sun Jia, “A new method for calibrating dual six-port network analyzers and for measuring two-port devices,” Acta Electronica Sinica, vol. 12, no. 6, pp. 6-10, 1984.
    • (1984) Acta Electronica Sinica , vol.12 , Issue.6 , pp. 6-10
    • Jia, S.1
  • 7
    • 84939697732 scopus 로고
    • Automatic analysis of multiport microwave networks
    • doctoral thesis, University of Montreal, Montreal, Canada
    • S. H. Li, “Automatic analysis of multiport microwave networks,” doctoral thesis, University of Montreal, Montreal, Canada, 1982.
    • (1982)
    • Li, S.H.1
  • 8
    • 0037491716 scopus 로고
    • Multiport network analyzers meeting the design need
    • June
    • R. A. Speciale, “Multiport network analyzers meeting the design need,” Microwave Syst. News, vol. 10, no. 6, pp. 67-89, June 1980.
    • (1980) Microwave Syst. News , vol.10 , Issue.6 , pp. 67-89
    • Speciale, R.A.1
  • 9
    • 0020125280 scopus 로고
    • A rigorous technique for measuring the scattering matrix of a multiport device with a 2-port network analyzer
    • May
    • J. C. Tippet and R. A. Speciale, “A rigorous technique for measuring the scattering matrix of a multiport device with a 2-port network analyzer,” IEEE Trans. Microwave Theory Tech., vol. MTT-30, pp. 661-666, May 1982.
    • (1982) IEEE Trans. Microwave Theory Tech. , vol.MTT-30 , pp. 661-666
    • Tippet, J.C.1    Speciale, R.A.2
  • 10
    • 0017469129 scopus 로고
    • Multiport network analysis by matrix renormalization employing voltage-wave, S-parameters with complex normalization
    • D. Woods, “Multiport network analysis by matrix renormalization employing voltage-wave, S-parameters with complex normalization,” Proc. Inst. Elec. Eng., vol. 124, no. 3, pp. 198-204, 1977.
    • (1977) Proc. Inst. Elec. Eng. , vol.124 , Issue.3 , pp. 198-204
    • Woods, D.1
  • 11
    • 0017535233 scopus 로고
    • Multiport network analysis by matrix renormalization: Extension to four ports
    • Sept.
    • D. Woods, “Multiport network analysis by matrix renormalization: Extension to four ports,” Proc. Inst. Elec. Eng., vol. 124, no. 9, pp. 749-753, Sept. 1977.
    • (1977) Proc. Inst. Elec. Eng. , vol.124 , Issue.9 , pp. 749-753
    • Woods, D.1
  • 12
    • 0018030735 scopus 로고
    • Multiport network analysis by matrix renormalization: Extension to 5- and 6-ports
    • Nov.
    • D. Woods, “Multiport network analysis by matrix renormalization: Extension to 5- and 6-ports,” Proc. Inst. Elec. Eng., vol. 125, no. 11, p. 1217, Nov. 1978.
    • (1978) Proc. Inst. Elec. Eng. , vol.125 , Issue.11 , pp. 1217
    • Woods, D.1
  • 13
    • 0019242384 scopus 로고
    • Derivation of the generalized scattering parameter renormalization transformation
    • (Houston, TX), Apr. 28-30
    • R. A. Speciale, “Derivation of the generalized scattering parameter renormalization transformation,” in Proc. IEEE CAS Int. Symp. Circuits Syst. (Houston, TX), Apr. 28-30, 1980, pp. 166-169.
    • (1980) Proc. IEEE CAS Int. Symp. Circuits Syst. , pp. 166-169
    • Speciale, R.A.1
  • 14
    • 0002395748 scopus 로고
    • Comments on ‘A rigorous technique for measuring the scattering matrix of a multiport device with a two-port network analyzer’
    • Jan.
    • H. Dropkin, “Comments on ‘A rigorous technique for measuring the scattering matrix of a multiport device with a two-port network analyzer’,” IEEE Trans. Microwave Theory Tech., vol. MTT-31, pp. 79-81, Jan. 1983.
    • (1983) IEEE Trans. Microwave Theory Tech. , vol.MTT-31 , pp. 79-81
    • Dropkin, H.1
  • 15
    • 0020153009 scopus 로고
    • Calibration of multiport reflectometers by means of four open/short circuit
    • S. H. Li and R. G. Bosisio, “Calibration of multiport reflectometers by means of four open/short circuit,” IEEE Trans. Microwave Theory Tech., vol. MTT-30, pp. 1085-1090, 1982.
    • (1982) IEEE Trans. Microwave Theory Tech. , vol.MTT-30 , pp. 1085-1090
    • Li, S.H.1    Bosisio, R.G.2
  • 16
    • 0022020028 scopus 로고
    • S-parameter measurements with a single six-port
    • J. D. Hunter and P. I. Somlo, “S-parameter measurements with a single six-port,” Electron. Lett. vol. 21, no. 4, pp. 157-158, 1985.
    • (1985) Electron. Lett. , vol.21 , Issue.4 , pp. 157-158
    • Hunter, J.D.1    Somlo, P.I.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.